RT Conference Proceedings
T1 Information Security Risk Assessment Methodology for Industrial Systems Supporting ISA/IEC 62443 Compliance
A1 Iturbe, Eider
A1 Rios, Erkuden
A1 Mansell, Jason
A1 Toledo, Nerea
AB In the context of Industry 4.0, digitalization is one of the key ingredients to foster economic growth and competitiveness of the industrial sector. But the speed in which digitalization is coming into play as well as the growing use of novel technologies such as Cyber Physical Systems (CPSs), Industrial Internet of Things (IIoT) and artificial intelligence techniques, comes hand by hand, with the increase in the attack vectors to these industries. So now, more than ever, there is a need for clear and reusable methodologies that support security experts in identifying the threats as well as the required measures to secure next-generation industrial infrastructures and solutions. This paper presents a risk assessment methodology for security and privacy of industrial solutions which systematises the activities to be carried out in a technology-, system-, and domain-agnostic manner and, thus, it can be reused in multiple types of systems. The methodology supports the compliance with the industrial cybersecurity standard ISA/IEC 62443.
PB Institute of Electrical and Electronics Engineers Inc.
SN 9798350327816
YR 2023
FD 2023
LK https://hdl.handle.net/11556/5014
UL https://hdl.handle.net/11556/5014
LA eng
NO Iturbe , E , Rios , E , Mansell , J & Toledo , N 2023 , Information Security Risk Assessment Methodology for Industrial Systems Supporting ISA/IEC 62443 Compliance . in International Conference on Electrical, Computer and Energy Technologies, ICECET 2023 . International Conference on Electrical, Computer and Energy Technologies, ICECET 2023 , Institute of Electrical and Electronics Engineers Inc. , 2023 IEEE International Conference on Electrical, Computer and Energy Technologies, ICECET 2023 , Cape Town , South Africa , 16/11/23 . https://doi.org/10.1109/ICECET58911.2023.10389369
NO conference
NO Publisher Copyright: © 2023 IEEE.
DS TECNALIA Publications
RD 27 sept 2024