TY  - JOUR
AU  - García, A.
AU  - Bellido, V.
AU  - Flaño, N.
AU  - Oñate, J. I.
PY  - 1992
DO  - 10.1016/0925-9635(92)90056-T
SN  - 0925-9635
UR  - https://hdl.handle.net/11556/3466
AB  - Discrepancies might arise among different laboratories when evaluating hardness values of thin coatings with conventional microhardness testers, which rely on optical examination of the indentation. These procedures can lead to significant measurement...
LA  - eng
TI  - Submicron characterization of B-C:H thin films produced by RF plasma CVD
TY  - journal article
ER  -