A Probabilistic Model and Capturing Device for Remote Simultaneous Estimation of Spectral Emissivity and Temperature of Hot Emissive Materials

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dc.contributor.authorPicon, Artzai
dc.contributor.authorAlvarez-Gila, Aitor
dc.contributor.authorArteche, Jose Antonio
dc.contributor.authorLopez, Gabriel A.
dc.contributor.authorVicente, Asier
dc.contributor.institutionTecnalia Research & Innovation
dc.contributor.institutionCOMPUTER_VISION
dc.contributor.institutionVISUAL
dc.date.issued2021
dc.descriptionPublisher Copyright: © 2013 IEEE.
dc.description.abstractEstimating the temperature of hot emissive samples (e.g. liquid slag) in the context of harsh industrial environments such as steelmaking plants is a crucial yet challenging task, which is typically addressed by means of methods that require physical contact. Current remote methods require information on the emissivity of the sample. However, the spectral emissivity is dependent on the sample composition and temperature itself, and it is hardly measurable unless under controlled laboratory procedures. In this work, we present a portable device and associated probabilistic model that can simultaneously produce quasi real-time estimates for temperature and spectral emissivity of hot samples in the [0.2, 12.0μm ] range at distances of up to 20m . The model is robust against variable atmospheric conditions, and the device is presented together with a quick calibration procedure that allows for in field deployment in rough industrial environments, thus enabling in line measurements. We validate the temperature and emissivity estimates by our device against laboratory equipment under controlled conditions in the [550, 850∘C ] temperature range for two solid samples with well characterized spectral emissivity’s: alumina ( α−Al2O3 ) and hexagonal boron nitride ( h−BN ). The analysis of the results yields Root Mean Squared Errors of 32.3∘C and 5.7∘C respectively, and well correlated spectral emissivity’s.en
dc.description.statusPeer reviewed
dc.format.extent17
dc.format.extent2811214
dc.identifier.citationPicon , A , Alvarez-Gila , A , Arteche , J A , Lopez , G A & Vicente , A 2021 , ' A Probabilistic Model and Capturing Device for Remote Simultaneous Estimation of Spectral Emissivity and Temperature of Hot Emissive Materials ' , IEEE Access , vol. 9 , 9481229 , pp. 100513-100529 . https://doi.org/10.1109/access.2021.3096599
dc.identifier.doi10.1109/access.2021.3096599
dc.identifier.issn2169-3536
dc.identifier.otherresearchoutputwizard: 11556/1169
dc.identifier.urlhttp://www.scopus.com/inward/record.url?scp=85110803263&partnerID=8YFLogxK
dc.language.isoeng
dc.relation.ispartofIEEE Access
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subject.keywordsProbabilistic computing
dc.subject.keywordsRadiometry
dc.subject.keywordsSpectral analysis
dc.subject.keywordsSpectral emissivity
dc.subject.keywordsSpectroscopy
dc.subject.keywordsSteel industry
dc.subject.keywordsTemperature measurement
dc.subject.keywordsProbabilistic computing
dc.subject.keywordsRadiometry
dc.subject.keywordsSpectral analysis
dc.subject.keywordsSpectral emissivity
dc.subject.keywordsSpectroscopy
dc.subject.keywordsSteel industry
dc.subject.keywordsTemperature measurement
dc.subject.keywordsGeneral Computer Science
dc.subject.keywordsGeneral Materials Science
dc.subject.keywordsGeneral Engineering
dc.subject.keywordsFunding Info
dc.subject.keywordsThis work was supported in part by the Basque Government (Hazitek AURRERA B: Advanced and Useful REdesign of CSP process for new steel gRAdes) under Grant ZE-2017/00009.
dc.subject.keywordsThis work was supported in part by the Basque Government (Hazitek AURRERA B: Advanced and Useful REdesign of CSP process for new steel gRAdes) under Grant ZE-2017/00009.
dc.titleA Probabilistic Model and Capturing Device for Remote Simultaneous Estimation of Spectral Emissivity and Temperature of Hot Emissive Materialsen
dc.typejournal article
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