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dc.contributor.authorKempe, Michael D.
dc.contributor.authorMiller, David C.
dc.contributor.authorNobles, Dylan L.
dc.contributor.authorSakurai, Keiichiro
dc.contributor.authorTucker, John
dc.contributor.authorBokria, Jayesh G.
dc.contributor.authorShioda, Tsuyoshi
dc.contributor.authorNanjundiah, Kumar
dc.contributor.authorYoshihara, Toshio
dc.contributor.authorBirchmier, Jeff
dc.contributor.authorZubillaga, Oihana
dc.contributor.authorWohlgemuth, John H.
dc.date.accessioned2016-03-11T10:47:17Z
dc.date.available2016-03-11T10:47:17Z
dc.date.issued2015
dc.identifier.citationRELIABILITY OF PHOTOVOLTAIC CELLS, MODULES, COMPONENTS, AND SYSTEMS VIII, Proceedings of SPIE, vol. 9563, 2015, DOI: 10.1117/12.2189662en
dc.identifier.isbn978-1-62841-729-6en
dc.identifier.urihttp://hdl.handle.net/11556/150
dc.description.abstractPhotovoltaic (PV) modules, operate at high voltages and elevated temperatures, and are known to degrade because of leakage current to ground. Related degradation processes may include: electric/ionic corrosion, electrochemical deposition, electromigration, and/or charge build-up in thin layers. The use of polymeric materials with a high resistivity is known to reduce the rate of potential induced degradation processes. Because of this, PV materials suppliers are placing increased importance on the encapsulant bulk resistivity, but there is no universally accepted method for making this measurement. The development of a resistivity test standard is described in this paper. We have performed a number of exploratory and round-robin tests to establish a representative and reproducible method for determining the bulk resistivity of polymeric materials, including encapsulation, backsheet, edge seals, and adhesives. The duration of measurement has been shown to greatly affect the results, e.g., an increase as great as 100X was seen for different measurement times. The standard has been developed using measurements alternating between an "on" and "off" voltage state with a weighted averaging function and cycle times of an hour.en
dc.language.isoengen
dc.publisherSPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USAen
dc.titleDevelopment of a Resistivity Standard for Polymeric Materials Used in Photovoltaic Modulesen
dc.typeconferenceObjecten
dc.isiYesen
dc.rights.accessRightsembargoedAccessen
dc.subject.keywordsphotovoltaicen
dc.subject.keywordsresistivityen
dc.subject.keywordsstandarden
dc.subject.keywordsencapsulanten


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